Talk (non-conference) (Invited)

FZJ-2022-03594

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Quantifying polarization changes at nitride semiconductor interfaces by scanning tunneling microscopy and off-axis electron holography(American Vacuum Society Taiwan Chapter symposium on “Advances in Scanned Probe Microscopy”).

Ebert, P. (Corresponding author)FZJ*

2021

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Contributing Institute(s):

1. Physik Nanoskaliger Systeme (ER-C-1)

Research Program(s):

1. 5351 - Platform for Correlative, In Situ and Operando Characterization (POF4-535) (POF4-535)

Appears in the scientific report 2022

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