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000910066 041__ $$aEnglish
000910066 1001_ $$0P:(DE-Juel1)130627$$aEbert, Philipp$$b0$$eCorresponding author$$ufzj
000910066 1112_ $$aTaiwan-AVS symposium$$cvirtuell$$d2021-01-28 - 2021-01-29$$wTaiwan
000910066 245__ $$aQuantifying polarization changes at nitride semiconductor interfaces by scanning tunneling microscopy and off-axis electron holography(American Vacuum Society Taiwan Chapter symposium on “Advances in Scanned Probe Microscopy”).$$f2021-01-28 - 
000910066 260__ $$c2021
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000910066 536__ $$0G:(DE-HGF)POF4-5351$$a5351 - Platform for Correlative, In Situ and Operando Characterization (POF4-535)$$cPOF4-535$$fPOF IV$$x0
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000910066 9141_ $$y2022
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