TY  - CONF
AU  - Ebert, Philipp
TI  - Quantifying polarization changes at nitride semiconductor interfaces by scanning tunneling microscopy and off-axis electron holography(American Vacuum Society Taiwan Chapter symposium on “Advances in Scanned Probe Microscopy”).
M1  - FZJ-2022-03594
PY  - 2021
T2  - Taiwan-AVS symposium
CY  - 28 Jan 2021 - 29 Jan 2021, virtuell (Taiwan)
Y2  - 28 Jan 2021 - 29 Jan 2021
M2  - virtuell, Taiwan
LB  - PUB:(DE-HGF)31
UR  - https://juser.fz-juelich.de/record/910066
ER  -