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@INPROCEEDINGS{Ebert:910066,
      author       = {Ebert, Philipp},
      title        = {{Q}uantifying polarization changes at nitride semiconductor
                      interfaces by scanning tunneling microscopy and off-axis
                      electron holography({A}merican {V}acuum {S}ociety {T}aiwan
                      {C}hapter symposium on “{A}dvances in {S}canned {P}robe
                      {M}icroscopy”).},
      reportid     = {FZJ-2022-03594},
      year         = {2021},
      month         = {Jan},
      date          = {2021-01-28},
      organization  = {Taiwan-AVS symposium, virtuell
                       (Taiwan), 28 Jan 2021 - 29 Jan 2021},
      subtyp        = {Invited},
      cin          = {ER-C-1},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {5351 - Platform for Correlative, In Situ and Operando
                      Characterization (POF4-535)},
      pid          = {G:(DE-HGF)POF4-5351},
      typ          = {PUB:(DE-HGF)31},
      url          = {https://juser.fz-juelich.de/record/910066},
}