| 001 | 910066 | ||
| 005 | 20230123101850.0 | ||
| 037 | _ | _ | |a FZJ-2022-03594 |
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| 100 | 1 | _ | |a Ebert, Philipp |0 P:(DE-Juel1)130627 |b 0 |e Corresponding author |u fzj |
| 111 | 2 | _ | |a Taiwan-AVS symposium |c virtuell |d 2021-01-28 - 2021-01-29 |w Taiwan |
| 245 | _ | _ | |a Quantifying polarization changes at nitride semiconductor interfaces by scanning tunneling microscopy and off-axis electron holography(American Vacuum Society Taiwan Chapter symposium on “Advances in Scanned Probe Microscopy”). |f 2021-01-28 - |
| 260 | _ | _ | |c 2021 |
| 336 | 7 | _ | |a Conference Paper |0 33 |2 EndNote |
| 336 | 7 | _ | |a Other |2 DataCite |
| 336 | 7 | _ | |a INPROCEEDINGS |2 BibTeX |
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