%0 Journal Article
%A Richstein, B.
%A Han, Y.
%A Zhao, Q.
%A Hellmich, L.
%A Klos, J.
%A Scholz, S.
%A Schreiber, Lars
%A Knoch, J.
%T Interface Engineering for Steep Slope Cryogenic MOSFETs
%J IEEE electron device letters
%V 43
%N 12
%@ 0193-8576
%C New York, NY
%I IEEE
%M FZJ-2023-00101
%P 2149 - 2152
%D 2022
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000924865400035
%R 10.1109/LED.2022.3217314
%U https://juser.fz-juelich.de/record/916798