000009175 001__ 9175 000009175 005__ 20230426083017.0 000009175 0247_ $$2DOI$$a10.1103/PhysRevB.81.054522 000009175 0247_ $$2WOS$$aWOS:000274998000119 000009175 0247_ $$2Handle$$a2128/10994 000009175 037__ $$aPreJuSER-9175 000009175 041__ $$aeng 000009175 082__ $$a530 000009175 084__ $$2WoS$$aPhysics, Condensed Matter 000009175 1001_ $$0P:(DE-HGF)0$$aKemmler, M.$$b0 000009175 245__ $$aMagnetic interference patterns in 0-pi superconductor/insulator/ferromagnet/superconductor Josephson junctions: Effects of asymmetry between 0 and pi regions 000009175 260__ $$aCollege Park, Md.$$bAPS$$c2010 000009175 300__ $$a054522 000009175 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article 000009175 3367_ $$2DataCite$$aOutput Types/Journal article 000009175 3367_ $$00$$2EndNote$$aJournal Article 000009175 3367_ $$2BibTeX$$aARTICLE 000009175 3367_ $$2ORCID$$aJOURNAL_ARTICLE 000009175 3367_ $$2DRIVER$$aarticle 000009175 440_0 $$04919$$aPhysical Review B$$v81$$x1098-0121$$y5 000009175 500__ $$aThis work is supported by the Deutsche Forschungsgemeinschaft (DFG) via the SFB/TRR 21 and Projects No. GO 944/3 and KO 1303/3. M. Kemmler acknowledges support by the Carl-Zeiss Stiftung. M. Weides is supported by DFG under Project No. WE 4359/1-1. 000009175 520__ $$aWe present a detailed analysis of the dependence of the critical current I-c on an in-plane magnetic field B of 0, pi, and 0-pi superconductor-insulator-ferromagnet-superconductor Josephson junctions. I-c(B) of the 0 and the pi junction closely follows a Fraunhofer pattern, indicating a homogeneous critical current density j(c)(x). The maximum of I-c(B) is slightly shifted along the field axis, pointing to a small remanent in-plane magnetization of the F-layer along the field axis. I-c(B) of the 0-pi junction exhibits the characteristic central minimum. I-c, however, has a finite value here, due to an asymmetry of j(c) in the 0 and the pi part. In addition, this I-c(B) exhibits asymmetric maxima and bumped minima. To explain these features in detail, flux penetration being different in the 0 part and the pi part needs to be taken into account. We discuss this asymmetry in relation to the magnetic properties of the F-layer and the fabrication technique used to produce the 0-pi junctions. 000009175 536__ $$0G:(DE-Juel1)FUEK412$$2G:(DE-HGF)$$aGrundlagen für zukünftige Informationstechnologien$$cP42$$x0 000009175 542__ $$2Crossref$$i2010-02-26$$uhttp://link.aps.org/licenses/aps-default-license 000009175 588__ $$aDataset connected to Web of Science 000009175 650_7 $$2WoSType$$aJ 000009175 7001_ $$0P:(DE-Juel1)VDB59925$$aWeides, M.$$b1$$uFZJ 000009175 7001_ $$0P:(DE-HGF)0$$aWeiler, M.$$b2 000009175 7001_ $$0P:(DE-HGF)0$$aOpel, M.$$b3 000009175 7001_ $$0P:(DE-HGF)0$$aGoennenwein, S.T.B.$$b4 000009175 7001_ $$0P:(DE-HGF)0$$aVasenko, A.S.$$b5 000009175 7001_ $$0P:(DE-HGF)0$$aGolubov, A.A.$$b6 000009175 7001_ $$0P:(DE-Juel1)VDB3107$$aKohlstedt, H.$$b7$$uFZJ 000009175 7001_ $$0P:(DE-HGF)0$$aKoelle, D.$$b8 000009175 7001_ $$0P:(DE-HGF)0$$aKleiner, R.$$b9 000009175 7001_ $$0P:(DE-HGF)0$$aGoldobin, E.$$b10 000009175 77318 $$2Crossref$$3journal-article$$a10.1103/physrevb.81.054522$$bAmerican Physical Society (APS)$$d2010-02-26$$n5$$p054522$$tPhysical Review B$$v81$$x1098-0121$$y2010 000009175 773__ $$0PERI:(DE-600)2844160-6$$a10.1103/PhysRevB.81.054522$$gVol. 81, p. 054522$$n5$$p054522$$q81<054522$$tPhysical review / B$$v81$$x1098-0121$$y2010 000009175 8567_ $$uhttp://dx.doi.org/10.1103/PhysRevB.81.054522 000009175 8564_ $$uhttps://juser.fz-juelich.de/record/9175/files/PhysRevB.81.054522.pdf$$yOpenAccess 000009175 8564_ $$uhttps://juser.fz-juelich.de/record/9175/files/PhysRevB.81.054522.gif?subformat=icon$$xicon$$yOpenAccess 000009175 8564_ $$uhttps://juser.fz-juelich.de/record/9175/files/PhysRevB.81.054522.jpg?subformat=icon-180$$xicon-180$$yOpenAccess 000009175 8564_ $$uhttps://juser.fz-juelich.de/record/9175/files/PhysRevB.81.054522.jpg?subformat=icon-700$$xicon-700$$yOpenAccess 000009175 8564_ $$uhttps://juser.fz-juelich.de/record/9175/files/PhysRevB.81.054522.pdf?subformat=pdfa$$xpdfa$$yOpenAccess 000009175 909CO $$ooai:juser.fz-juelich.de:9175$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire 000009175 9141_ $$y2010 000009175 915__ $$0LIC:(DE-HGF)APS-112012$$2HGFVOC$$aAmerican Physical Society Transfer of Copyright Agreement 000009175 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess 000009175 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed 000009175 9131_ $$0G:(DE-Juel1)FUEK412$$aDE-HGF$$bSchlüsseltechnologien$$kP42$$lGrundlagen für zukünftige Informationstechnologien (FIT)$$vGrundlagen für zukünftige Informationstechnologien$$x0 000009175 9201_ $$0I:(DE-Juel1)VDB786$$d31.12.2010$$gIFF$$kIFF-6$$lElektronische Materialien$$x0 000009175 9201_ $$0I:(DE-82)080009_20140620$$gJARA$$kJARA-FIT$$lJülich-Aachen Research Alliance - Fundamentals of Future Information Technology$$x1 000009175 970__ $$aVDB:(DE-Juel1)118641 000009175 9801_ $$aFullTexts 000009175 980__ $$aVDB 000009175 980__ $$aConvertedRecord 000009175 980__ $$ajournal 000009175 980__ $$aI:(DE-Juel1)PGI-7-20110106 000009175 980__ $$aI:(DE-82)080009_20140620 000009175 980__ $$aUNRESTRICTED 000009175 981__ $$aI:(DE-Juel1)PGI-7-20110106 000009175 981__ $$aI:(DE-Juel1)VDB881 000009175 999C5 $$1L. 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