Journal Article

PreJuSER-9175

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Magnetic interference patterns in 0-pi superconductor/insulator/ferromagnet/superconductor Josephson junctions: Effects of asymmetry between 0 and pi regions

Kemmler, M. ; Weides, M.FZJ* ; Weiler, M. ; Opel, M. ; Goennenwein, S. T. B. ; Vasenko, A. S. ; Golubov, A. A. ; Kohlstedt, H.FZJ* ; Koelle, D. ; Kleiner, R. ; Goldobin, E.

2010
APS College Park, Md.

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Please use a persistent id in citations: http://hdl.handle.net/2128/10994  doi:10.1103/PhysRevB.81.054522

Abstract: We present a detailed analysis of the dependence of the critical current I-c on an in-plane magnetic field B of 0, pi, and 0-pi superconductor-insulator-ferromagnet-superconductor Josephson junctions. I-c(B) of the 0 and the pi junction closely follows a Fraunhofer pattern, indicating a homogeneous critical current density j(c)(x). The maximum of I-c(B) is slightly shifted along the field axis, pointing to a small remanent in-plane magnetization of the F-layer along the field axis. I-c(B) of the 0-pi junction exhibits the characteristic central minimum. I-c, however, has a finite value here, due to an asymmetry of j(c) in the 0 and the pi part. In addition, this I-c(B) exhibits asymmetric maxima and bumped minima. To explain these features in detail, flux penetration being different in the 0 part and the pi part needs to be taken into account. We discuss this asymmetry in relation to the magnetic properties of the F-layer and the fabrication technique used to produce the 0-pi junctions.

Keyword(s): J

Note: This work is supported by the Deutsche Forschungsgemeinschaft (DFG) via the SFB/TRR 21 and Projects No. GO 944/3 and KO 1303/3. M. Kemmler acknowledges support by the Carl-Zeiss Stiftung. M. Weides is supported by DFG under Project No. WE 4359/1-1.

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Contributing Institute(s):

1. Elektronische Materialien (IFF-6)
2. Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)

Research Program(s):

1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2010

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