Journal Article

FZJ-2013-05998

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Transient photocurrents as a spatially resolved probe of carrier transport and defect distributions in silicon thin films

Reynolds, S. (Corresponding author) ; Brüggemann, R. ; Grootoonk, B.FZJ* ; Smirnov, V.FZJ*

2013
Elsevier New York, NY [u.a.]

This record in other databases:    

Please use a persistent id in citations: http://hdl.handle.net/2128/5655  doi:10.1016/j.mseb.2012.10.040

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Contributing Institute(s):

1. Photovoltaik (IEK-5)

Research Program(s):

1. 111 - Thin Film Photovoltaics (POF2-111) (POF2-111)
2. HITEC - Helmholtz Interdisciplinary Doctoral Training in Energy and Climate Research (HITEC) (HITEC-20170406) (HITEC-20170406)

Appears in the scientific report 2013

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Database coverage:
; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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