| Home > Publications database > Standing-wave excited soft x-ray photoemission microscopy: Application to Co microdot magnetic arrays |
| Journal Article | FZJ-2015-03930 |
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2010
American Inst. of Physics
Melville, NY
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Please use a persistent id in citations: http://hdl.handle.net/2128/16825 doi:10.1063/1.3478215
Abstract: We demonstrate the addition of depth resolution to the usual two-dimensional images in photoelectron emission microscopy(PEEM), with application to a square array of circular magnetic Co microdots. The method is based on excitation with soft x-ray standing-waves generated by Bragg reflection from a multilayer mirror substrate. Standing wave is moved vertically through sample simply by varying the photon energy around the Bragg condition. Depth-resolved PEEM images were obtained for all of the observed elements. Photoemission intensities as functions of photon energy were compared to x-ray optical calculations in order to quantitatively derive the depth-resolved film structure of the sample.
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