Journal Article PreJuSER-47051

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png
Detection of magnetic contaminations in industrial products using HTS SQUIDs

 ;  ;  ;  ;  ;  ;  ;  ;

2005
IEEE New York, NY

IEEE transactions on applied superconductivity 15, 729 - 732 () [10.1109/TASC.2005.850027]

This record in other databases:    

Please use a persistent id in citations:   doi:

Abstract: Many products in the pharmaceutical and food industry are packaged in metallized wrappings. With standard high-frequency search coil metal detectors, they can only be tested for metal contaminations before they are wrapped. However, a key requirement of industrial quality control is the inspection of the products at the end of the production line. We have developed an inspection system for detecting the magnetic remanence of the contaminants. The system utilizes two HTS rf SQUID magnetometers with step edge junctions immersed in liquid nitrogen. The SQUIDs are arranged such that they cover the product channel in a rotated planar electronic gradiometer configuration. In order to suppress the low-frequency magnetic disturbances typically found in industrial environment, the product channel and the SQUID system were mounted inside a coaxial three-layer Mumetal shield. In combination with the gradiometric suppression, homogeneous low-frequency disturbance fields were attenuated by a factor of 400,000. The sensitivity of the system for small magnetic particles was determined experimentally, using numerous steel balls and splinters. A stainless steel particle of 3 mu g, corresponding to a sphere diameter of 0.09 mm, was detected with and without aluminized wrapping.

Keyword(s): J ; metal detector (auto) ; nondestructive testing (auto) ; remote magnetometry (auto) ; SQUIDs (auto)


Note: Record converted from VDB: 12.11.2012

Contributing Institute(s):
  1. Institut für Bio- und Chemosensoren (ISG-2)
  2. Center of Nanoelectronic Systems for Information Technology (CNI)
Research Program(s):
  1. Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik (I01)

Appears in the scientific report 2005
Notes: This version is available at the following Publisher URL: http://ieeexplore.ieee.org/Xplore/dynhome.jsp
Database coverage:
OpenAccess
Click to display QR Code for this record

The record appears in these collections:
Document types > Articles > Journal Article
Workflow collections > Public records
IBN > IBN-2
Publications database
Open Access

 Record created 2012-11-13, last modified 2020-04-23


OpenAccess:
Download fulltext PDF
External link:
Download fulltextFulltext by OpenAccess repository
Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)