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Home > External Publications > Vita Publications > Angle-resolved scanning transmission electron microscopy employing an iris aperture

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Angle-resolved scanning transmission electron microscopy employing an iris aperture

Müller-Caspary, K.FZJ* ; Oppermann, O. ; Grieb, T. ; Rosenauer, A. ; Krause, F. ; Schowalter, M. ; Mehrtens, T. ; Potapov, P. ; Beyer, A. ; Volz, K.

2016

Electron Microscopy and Analysis Group Annual Conference (EMAG 2016), Durham, United Kingdom, 7 Apr 2016 - 8 Apr 2016

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Record created 2018-07-26, last modified 2018-07-26

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