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| Home > Publications database > A Software-Scalable Analog-To-Digital Converter for Particle Detectors in 28NM BULK CMOS |
| Home > Publications database > A Software-Scalable Analog-To-Digital Converter for Particle Detectors in 28NM BULK CMOS |
| Poster (After Call) | FZJ-2024-00047 |
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2023
Abstract: New discoveries in particle physics put an everincreasingdemand on the installed electronics in detector experiments.Currently used process technologies for integratedelectronics, as 65nm and larger, are reaching their limits ofresolution over power consumption and integration factor. Theconsequential progression to a smaller process technology comeswith increased cost and design complexity resulting in a higherimpact on the overall success of a project. The currently discussedway out of this predicament is concentrating cost and effortin fewer, more generic solutions covering a wider range ofapplications. A first prototype of a software-scalable Analog-to-Digital converter manufactured in a 28nm bulk CMOS processtechnology is presented, which is part of a generic frontendsolution concept. It incorporates a low-power mode with 8 bit ofresolution, a maximum sample rate of 480 MSPS, and a powerconsumption of 1.62mW. When higher resolution is needed, ahigh-precision mode can be used with a resolution of 11 bit, amaximum sample rate of 350 MSPS and a power consumptionof 5.6mW. The complete software-scalable Analog-to-Digitalconverter takes 0.029mm2 of chip area. Overall, the first chipis 1mm2 in size. It includes two channels, a high-speed parallelcommunication interface, a clock buffer and memory for 8168Analog-to-Digital converter samples.
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