Journal Article

FZJ-2024-00637

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Evolution of Short‐Range Order of Amorphous GeTe Upon Structural Relaxation Obtained by TEM Diffractometry and RMC Methods

Stenz, C. ; Pries, J. ; Surta, T. W. ; Gaultois, M. W. ; Wuttig, M. (Corresponding author)FZJ*

2023
Wiley-VCH Weinheim

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Please use a persistent id in citations: doi:10.1002/advs.202304323  doi:10.34734/FZJ-2024-00637

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Contributing Institute(s):

1. JARA Institut Green IT (PGI-10)

Research Program(s):

1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)

Appears in the scientific report 2023

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Database coverage:
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