Journal Article FZJ-2024-02137

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Irradiation-dependent topology optimization of metallization grid patterns and variation of contact layer thickness used for latitude-based yield gain of thin-film solar modules

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2022
Springer Nature Switzerland AG Cham

MRS advances 7(30), 706 - 712 () [10.1557/s43580-022-00321-3]

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Contributing Institute(s):
  1. Photovoltaik (IEK-5)
Research Program(s):
  1. 1215 - Simulations, Theory, Optics, and Analytics (STOA) (POF4-121) (POF4-121)

Database coverage:
Medline ; Creative Commons Attribution CC BY 4.0 ; OpenAccess ; Clarivate Analytics Master Journal List ; DEAL Springer ; Emerging Sources Citation Index ; IF < 5 ; JCR ; SCOPUS ; Web of Science Core Collection
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Dokumenttypen > Aufsätze > Zeitschriftenaufsätze
Institutssammlungen > IMD > IMD-3
Workflowsammlungen > Öffentliche Einträge
IEK > IEK-5
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Open Access

 Datensatz erzeugt am 2024-03-28, letzte Änderung am 2024-07-12


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