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| Journal Article | FZJ-2025-01021 |
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2024
Elsevier B.V.
Amsterdam
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Please use a persistent id in citations: doi:10.1016/j.joule.2024.06.013 doi:10.34734/FZJ-2025-01021
Abstract: Organic photovoltaic (OPV) devices achieve close to 20% efficiency, and high intrinsic light stability of a few active layer materials has been reported under concentrated conditions, raising the expectations for long-term stable products. Nevertheless, currently no high-efficiency (>10%) OPV module with long-term stability is commercially available. A major bottleneck for OPV stability is the interface layers. Most large-area OPV modules rely on an inverted architecture with a thick PEDOT:PSS interface layer on top to protect the active layer from processing solvents in electrode materials and encapsulation glues. Although those architectures work well for fullerene-based systems, severe stability limitations have arisen with high-efficiency non-fullerene acceptors (NFAs). We present a novel hole-transport-layer concept that provides exceptional stability for devices with high-efficiency NFA materials in an industrially relevant inverted architecture including a PEDOT:PSS top layer.
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