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Twinning mediated intralayer frustration governs structural degradation in layered Li-rich oxide cathode
Yang, T.FZJ* ; Yang, M. ; Huang, Z. ; Wang, R.FZJ* ; Ji, W. ; Lu, P.-H.FZJ* ; Zeng, T. ; Li, Z. ; Wang, J. ; Dunin-Borkowski, R. E.FZJ* ; Jin, L.FZJ* ; Xiao, Y. (Corresponding author)
2025
Springer Nature
[London]
This record in other databases:
Please use a persistent id in citations: doi:10.1038/s41467-025-61386-w doi:10.34734/FZJ-2025-03315
Contributing Institute(s):
- Physik Nanoskaliger Systeme (ER-C-1)
Research Program(s):
- 5351 - Platform for Correlative, In Situ and Operando Characterization (POF4-535) (POF4-535)
Appears in the scientific report
2025
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