| Hauptseite > Publikationsdatenbank > A synchrotron X-ray diffraction and electron microscopy study of vanadium-doped UO2 |
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| Journal Article | FZJ-2025-03447 |
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2025
Springer Nature Switzerland AG
Cham
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Please use a persistent id in citations: doi:10.1557/s43580-025-01209-8 doi:10.34734/FZJ-2025-03447
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