Journal Article

FZJ-2026-01785

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Robust Material Properties in Epitaxial In 2 Te 3 Thin Films across Varying Thicknesses

Buchta, M. ; Hoff, F. ; Bothe, L. ; Penner, N. ; Ringkamp, C. ; Schmidt, T. ; Köttgen, J. ; Veslin, T. ; Mak, K. L. ; Frank, J. ; Kim, D. ; Wuttig, M. (Corresponding author)FZJ*

2025
Wiley-VCH Weinheim

This record in other databases:  

Please use a persistent id in citations: doi:10.1002/smll.202508738

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Contributing Institute(s):

1. JARA Institut Green IT (PGI-10)

Research Program(s):

1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)

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Database coverage:
; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; DEAL Wiley ; Essential Science Indicators ; IF >= 10 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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