Journal Article FZJ-2026-02080

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png
Laser-Induced Degradation of Bi2Se3 THz Emitters Revealed by Raman Spectroscopy

 ;  ;  ;  ;  ;  ;  ;  ;  ;  ;

2026
MDPI Basel

Photonics 13(3), 278 - () [10.3390/photonics13030278]

This record in other databases:  

Please use a persistent id in citations: doi:

Abstract: We present an investigation of the thermal damage threshold of passivated Bi2Se3 films upon laser illumination, with a focus on their employment in terahertz (THz) spectroscopic applications. Passivation was achieved by depositing a thin 3 nm Al capping layer which, exposed to the ambient, forms a natural oxide. In THz transient emission experiments, the samples were exposed to a train of 100 fs wide laser pulses with 800 nm wavelength at78 MHz repetition rate and peak power density up to 295 mW/μm2. For the sake of comparison, the films were also exposed to continuous wave laser light with a wavelength of 532 nm in the average optical power density range from 5 × 10−2 mW/μm2 to 50 mW/μm2. In both cases, changes in film appearance, detected by optical microscopy, or even film removal in a small area close to the center of the illuminated spot could be induced. Ramanspectroscopy provided evidence that the crystalline phase of Bi2Se3 films is present in areas that have been exposed but not damaged. Conversely, in the film region illuminated with the highest peak power density no Raman signal was detected in the range under investigation which we ascribe to material removal. At the perimeter of this ablated area, we observed a dominant Raman mode at approximately 255 cm−1 that we can attribute to selenium and indicates partial Bi2Se3 decomposition. In contrast, we observed Raman spectra corresponding to as-deposited Bi2Se3 only a few micrometers away from the laser-damaged area. Hence, the observed THz radiation originates from this illuminated but undamaged region. This detailed knowledge is expected to serve as a guide for designing the emitter’s thermal management and choosing laser parameters for optimal operation.

Classification:

Contributing Institute(s):
  1. Materialwissenschaft u. Werkstofftechnik (ER-C-2)
Research Program(s):
  1. 5353 - Understanding the Structural and Functional Behavior of Solid State Systems (POF4-535) (POF4-535)

Appears in the scientific report 2026
Database coverage:
Medline ; Creative Commons Attribution CC BY (No Version) ; DOAJ ; Article Processing Charges ; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; DOAJ Seal ; Essential Science Indicators ; Fees ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection
Click to display QR Code for this record

The record appears in these collections:
Institute Collections > ER-C > ER-C-2
Workflow collections > Relevant for Publication database
Workflow collections > User submitted records

 Record created 2026-03-18, last modified 2026-03-26


Restricted:
Download fulltext PDF
External link:
Download fulltextFulltext
Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)