Journal Article

FZJ-2026-02995

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Overcoming the aberration-limit of a non-corrected Transmission Electron Microscope with computational ghost imaging

Rosi, P. ; Viani, L. ; Rotunno, E. ; Frabboni, S. ; Tavabi, A. H.FZJ* ; Dunin-Borkowski, R. E.FZJ* ; Roncaglia, A. ; Grillo, V. (Corresponding author)

2024
EDP Sciences Les Ulis

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Please use a persistent id in citations: doi:10.1051/bioconf/202412904035  doi:10.34734/FZJ-2026-02995

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Contributing Institute(s):

1. Physik Nanoskaliger Systeme (ER-C-1)

Research Program(s):

1. 5351 - Platform for Correlative, In Situ and Operando Characterization (POF4-535) (POF4-535)
2. SMART-electron - ULTRAFAST ALL-OPTICAL SPATIO-TEMPORAL ELECTRON MODULATORS: OPENING NEW FRONTIERS IN ELECTRON MICROSCOPY (964591) (964591)
3. IMPRESS - Interoperable electron Microscopy Platform for advanced RESearch and Services (101094299) (101094299)

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Database coverage:
; ; ; DOAJ Seal

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