Journal Article

FZJ-2026-03524

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Atomic resolution imaging of the strength and 3D direction of atomic displacements in functional oxide thin films

Maclaren, I. (Corresponding author) ; Silinga, A. ; Barthel, J.FZJ* ; Kleibeuker, J. ; MacManus-Driscoll, J. L. ; Allen, C. S. ; Kirkland, A. I.

2025
APS College Park, MD

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Please use a persistent id in citations: doi:10.1103/p6qm-hpvk  doi:10.34734/FZJ-2026-03524

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Contributing Institute(s):

1. Materialwissenschaft u. Werkstofftechnik (ER-C-2)

Research Program(s):

1. 5353 - Understanding the Structural and Functional Behavior of Solid State Systems (POF4-535) (POF4-535)

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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