Journal Article

FZJ-2026-03598

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction

Gasser, F. ; John, S. ; Smets, J. ; Simbrunner, J. ; Fratschko, M. ; Rubio-Giménez, V. ; Ameloot, R. ; Steinrück, H.-G.FZJ* ; Resel, R.

2025
Munksgaard Copenhagen

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Please use a persistent id in citations: doi:10.1107/S1600576725004935  doi:10.34734/FZJ-2026-03598

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Contributing Institute(s):

1. Infrastruktur u. wissenschaftliche Koordination (IHE-I)

Research Program(s):

1. 899 - ohne Topic (POF4-899) (POF4-899)

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; DEAL Wiley ; Ebsco Academic Search ; Essential Science Indicators ; IF >= 5 ; JCR ; Nationallizenz ; PubMed Central ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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