Journal Article

FZJ-2026-03866

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Atomic Resolution in Near-Edge Core-Loss Mapping Beyond the Conventional Delocalization Limit

Wu, J. (Corresponding author) ; Barthel, J.FZJ* ; Allen, L. J. ; Haruta, M.

2026
APS College Park, Md.

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Please use a persistent id in citations: doi:10.1103/9y69-62kf  doi:10.34734/FZJ-2026-03866

Abstract: The spatial resolution of core-loss electron energy-loss spectroscopy (EELS) is limited by thedelocalization of inelastic scattering from long-range Coulomb interactions, especially for light-elementedges at low energy losses. Here we demonstrate atomic-resolution imaging of the Si L edge in Si [110]using dark-field annular EELS that selectively detects high-angle inelastic scattering. Although the intrinsicexcitation delocalization remains unchanged, momentum-transfer–selective detection suppresses longrangecontributions, enabling the 1.36 Å Si dumbbell to be resolved.

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Contributing Institute(s):

1. Materialwissenschaft u. Werkstofftechnik (ER-C-2)

Research Program(s):

1. 5353 - Understanding the Structural and Functional Behavior of Solid State Systems (POF4-535) (POF4-535)

Appears in the scientific report 2026

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF >= 5 ; JCR ; Nationallizenz ; SCOAP3 sponsored Journal ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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