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Low through-plane thermal conductivity in amorphous HfO2/SiO2 nanolaminates
Mende, F. (Corresponding author) ; Ostien, O. ; Schöne, F. ; Potjan, R. ; Sprave, I.FZJ* ; Dütz, D. ; Frede, J. ; Meier, T. ; Kleemann, H. ; Wislicenus, M. ; Lilienthal-Uhlig, B. ; Eng, L. M.
2026
American Inst. of Physics
Melville, NY
This record in other databases:
Please use a persistent id in citations: doi:10.1063/5.0312700 doi:10.34734/FZJ-2026-05634
Contributing Institute(s):
- JARA Institut Quanteninformation (PGI-11)
Research Program(s):
- 5221 - Advanced Solid-State Qubits and Qubit Systems (POF4-522) (POF4-522)
Appears in the scientific report
2026
Database coverage:
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; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; National-Konsortium ; PubMed Central ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection