Journal Article

PreJuSER-12133

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Analysis of X-ray reflectivity data from low-contrast polymer bilayers using a Fourier method

Seeck, O. H.FZJ* ; Kaendler, I. D. ; Sinha, S. K. ; Tolan, M. ; Shin, K. ; Rafailovich, M. H. ; Sokolov, J. ; Kolb, R.

2000
American Institute of Physics Melville, NY

Please use a persistent id in citations: http://hdl.handle.net/2128/845

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Institut für Festkörperforschung (IFF)

Research Program(s):

1. Polymere, Membranen und komplexe Flüssigkeiten (23.30.0)
2. Methodenentwicklung für Synchrotron- und Neutronenstrahlung (23.89.1)

Appears in the scientific report 2000
Notes: This version is available at the following URL: http://apl.aip.org

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Database coverage:

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