Unusual lattice distortion in Ba0.5Sr0.5TiO3 thin films on a LaAlO3 substrate

Chen, J. H.; Chen, C. L.; Jia, C. L.; Urban, K.

doi:10.1063/1.1500413

Journal Article

PreJuSER-12192

Unusual lattice distortion in Ba0.5Sr0.5TiO3 thin films on a LaAlO3 substrate

Chen, J. H.FZJ* ; Jia, C. L.FZJ* ; Urban, K.FZJ* ; Chen, C. L.

2002
American Institute of Physics Melville, NY

Applied physics letters 81, 1291 (2002) [10.1063/1.1500413]

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Please use a persistent id in citations: http://hdl.handle.net/2128/1036 doi:10.1063/1.1500413

Abstract: Transmission electron microscopy (TEM) of a perovskite Ba0.5Sr0.5TiO3 thin film, grown on a (001) LaAlO3 substrate by pulsed-laser ablation, reveals that the film of single-crystal quality has an unusually distorted lattice with lattice parameters a and b (parallel to the interface) larger than c (perpendicular to the interface) by 1.4%. There is evidence that the as-examined Ba0.5Sr0.5TiO3 film is a variant of its high-temperature cubic phase due to its anisotropic thermal contraction during cooling. A large lattice mismatch value of 5.7% (to be compared to the normal value of 4.13%) is observed from selected area electron diffraction patterns and high-resolution TEM images of cross-sectional specimens, which suggests that the growing high-temperature film under the film growth condition may have a larger lattice constant and a different thermal expansion behavior with respect to the bulk material. (C) 2002 American Institute of Physics.

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