Journal Article

FZJ-2013-05391

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Conductance fuctuations in VHF-PECVD grown hydrogenated microcrystalline silicon thin films

Gunes, M. (Corresponding author) ; Johanson, R. E. ; Kasap, S. O. ; Finger, F.FZJ* ; Lambertz, A.FZJ*

2003
Springer Science + Business Media B.V Dordrecht [u.a.]

Abstract: Coplanar conductance fluctuations or excess noise of undoped hydrogenated microcrystalline silicon (c-Si : H) thin films grown by VHF-PECVD from silane–hydrogen mixtures with silane concentrations from 2% to 6% have been studied between room temperature and 470 K. We report that undoped c-Si : H thin films show similar noise-power spectra to those of undoped a-Si : H films in a coplanar sample geometry. At lower temperatures, the noise with the slope =0.600.07 and at higher temperatures, the noise with the slope close to unity dominate the spectrum. The noise magnitude decreases with decreasing silane concentration and becomes strongly temperature dependent with increased crystallinity.

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Contributing Institute(s):

1. Photovoltaik (IEK-5)

Research Program(s):

1. 111 - Thin Film Photovoltaics (POF2-111) (POF2-111)

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Database coverage:
Current Contents - Physical, Chemical and Earth Sciences ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection ; Zoological Record

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