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Electronically non-alloyed state of a statistical single atomic layer semiconductor alloy
Ebert, P. (Corresponding author)FZJ* ; Landrock, S. ; Jiang, Y. ; Wu, K. H. ; Wang, E. G. ; Dunin-Borkowski, R.FZJ*
2013
2013PICO 2013, Second Conference on Frontiers of Abberation Corrected Electron Microscopy, Kasteel VaalsbroekKasteel Vaalsbroek, NL, 9 Oct 2013 - 12 Oct 20132013-10-092013-10-12
Contributing Institute(s):
- Mikrostrukturforschung (PGI-5)
Research Program(s):
- 421 - Frontiers of charge based Electronics (POF2-421) (POF2-421)
Appears in the scientific report
2013