| Home > Publications database > EU2+-DOPED CsBr PHOTOSTIMULABLE X-RAY STORAGE PHOSPHORS — ANALYSIS OF DEFECT STRUCTURE BY HIGH-FREQUENCY EPR |
| Journal Article | FZJ-2013-05841 |
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2014
World Scientific
Singapore {[u.a.]
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Please use a persistent id in citations: doi:10.1142/S1793604713500732
Abstract: Received 19 July 2013; Revised ; Accepted 8 October 2013; Published. Eu2þ-doped CsBr in form of needle image plates is a promising alternative to the granular Eu2þ:BaFBr X-ray storage phosphor with respect to photo-stimulated luminescence, yield and spatial resolution. However, in order to understand the corresponding mechanisms on an atomic scale, the defect structure of Eu2þ-doped CsBr photostimulable X-ray storage phosphors has to be analyzed. By means of high-frequency electron paramagnetic resonance (EPR) spectroscopy, three types of defects have been observed — an electrically neutral dimeric (...) defect complex and a neutral trimeric (...) defect complex (FZ -center), as well as acceptor-type F-centers (...) that are generated by the trapping of electrons at initially neutral bromine vacancies. Keywords: X-ray storage phosphors; CsBr; defect structure; Eu2þ-doping; EPR.
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