Journal Article

FZJ-2014-01853

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Compositional study of defects in microcrystalline silikon solar cells using spectral decomposition in the scanning Transmission electron microscope

Duchamp, M.FZJ* ; Lachmann, M.FZJ* ; Boothroyd, C. B.FZJ* ; Kovacs, A.FZJ* ; Haug, F. J. ; Ballif, C. ; Dunin-Borkowski, R.FZJ*

2013
American Institute of Physics Melville, NY

This record in other databases:  

Please use a persistent id in citations: http://hdl.handle.net/2128/16836  doi:10.1063/1.4800569

Abstract: The chemical compositions of defective regions in microcrystalline thin film Si solar cells are studied using energy-dispersive X-ray spectroscopy and electron energy-loss spectroscopy (EELS) in the scanning transmission electron microscope. Nanometer-resolved chemical analysis reveals the presence of ZnO in micrometer-long defective regions. Due to the recent application of unmixing algorithm to EELS, the chemical compositions of the defective regions are determined objectively, without introducing artefacts from the fitting procedures. It is shown that the defective regions in the Si layer are filled by ZnO, which diffuses along voids that propagate from the bottom up to the top ZnO contacts.

---

Contributing Institute(s):

1. Mikrostrukturforschung (PGI-5)

Research Program(s):

1. 422 - Spin-based and quantum information (POF2-422) (POF2-422)

Appears in the scientific report 2013

---

Database coverage:
; ; Allianz-Lizenz / DFG ; Current Contents - Social and Behavioral Sciences ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

---