Voltage preamplifier for extensional quarz sensors used in scanning force microscopy

Morawski, I.; Blicharski, J.; Voigtländer, B.

doi:10.1063/1.3594103

Journal Article

PreJuSER-15825

Voltage preamplifier for extensional quarz sensors used in scanning force microscopy

Morawski, I.FZJ* ; Blicharski, J. ; Voigtländer, B.FZJ*

2011
American Institute of Physics [S.l.]

Review of scientific instruments 82, 063701 (2011) [10.1063/1.3594103]

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Please use a persistent id in citations: http://hdl.handle.net/2128/7308 doi:10.1063/1.3594103

Abstract: Extensional-mode quartz resonators are being increasingly used as force sensors in dynamic scanning force microscopy or atomic force microscopy (AFM). We propose a voltage preamplifier in order to amplify the charge induced on quartz electrodes. The proposed solution has some advantages over the typically used current-to-voltage converters. First, the gain does not depend on the inner parameters of the quartz resonator, which are usually unknown for the specific resonator and may even vary during the measurement. Second, with such an amplifier a better signal-to-noise ratio can be achieved. Finally, we present AFM images of the Si(111) and the SiO(2) surfaces obtained by the voltage preamplifier with simultaneously recorded tunneling current.

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Note: This project was supported by a JARA-Start grant. The authors are indebted to Dr. D. Mayer for technical assistance in the impedance measurements and to Dr. H. J. Krause for help with the spectral noise density measurements. We also thank H. P. Bochem for the electron microscopy imaging of the sensors and the tips.

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