Journal Article

FZJ-2015-03836

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Aberration-corrected transmission electron microscopy analyses of GaAs/Si interfaces in wafer-bonded multi-junction solar cells

Häussler, D. ; Houben, L.FZJ* ; Essig, S. ; Kurttepeli, M. ; Dimroth, F. ; Dunin-Borkowski, R. E. ; Jäger, W. (Corresponding Author)FZJ*

2013
Elsevier Science Amsterdam

This record in other databases:  

Please use a persistent id in citations: doi:10.1016/j.ultramic.2013.07.005

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Contributing Institute(s):

1. Mikrostrukturforschung (PGI-5)

Research Program(s):

1. 42G - Peter Grünberg-Centre (PG-C) (POF2-42G41) (POF2-42G41)

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Database coverage:
; BIOSIS Previews ; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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