D08: High Resolution Spectroscopy

Meier, G.; Brückel, Thomas; Richter, Dieter; Zorn, Reiner; Angst, Manuel

Contribution to a conference proceedings/Contribution to a book

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D08: High Resolution Spectroscopy

Meier, G. (Corresponding author) ; ; Angst, M. (Editor)FZJ* ; Brückel, T. (Editor)FZJ* ; Richter, D. (Editor)FZJ* ; Zorn, R. (Editor)FZJ*

2012
Forschungszentrum Jülich GmbH, JCNS, PGI, ICS, IAS Jülich
ISBN: 978-3-89336-759-7

43rd IFF Spring School: "Scattering Methods for Condensed Matter Research: Towards Novel Applications at Future Sources" / M. Angst, Th. Brückel, D. Richter, R. Zorn (Eds.) ; Schriften des Forschungszentrums Jülich / Reihe Schlüsseltechnologien / Key Technologies, Vol. 33, Forschungszentrum Jülich GmbH, JCNS, PGI, ICS, IAS; 2012; 978-3-89336-759-7
Scattering Methods for Condensed Matter Research: Towards Novel Applications at Future Sources, 43rd IFF Spring School, Jülich, Germany, 5 Mar 2012 - 16 Mar 2012 Jülich : Forschungszentrum Jülich GmbH, JCNS, PGI, ICS, IAS, Schriften des Forschungszentrums Jülich / Reihe Schlüsseltechnologien / Key Technologies 33, : Lecture Notes of the 43rd IFF Spring School 2012, D8.1 - D8.22 (2012)

Please use a persistent id in citations: http://hdl.handle.net/2128/4729

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