Determination of the thermal conductivity tensor of the n=7 Aurivillius phase Sr4Bi4Ti7024

Zurbuchen, M.A.; Schubert, J.; Schlom, D.G.; Cahill, D.G.; Jia, Y.

doi:10.1063/1.4733616

Journal Article

Determination of the thermal conductivity tensor of the n=7 Aurivillius phase Sr4Bi4Ti7024

Zurbuchen, M. A. ; Cahill, D. G. ; Schubert, J.FZJ* ; Jia, Y. ; Schlom, D. G.

2012
American Institute of Physics Melville, NY

Applied physics letters 101, 021904 (2012) [10.1063/1.4733616]

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Please use a persistent id in citations: http://hdl.handle.net/2128/7577 doi:10.1063/1.4733616

Abstract: A challenge in the preparation of advanced materials that exist only as thin films is to establish their properties, particularly when the materials are of low symmetry or the tensor properties of interest are of high rank. Using Sr4Bi4Ti7O24 as an example, we show how the preparation of oriented epitaxial films of multiple orientations enables the thermal conductivity tensor of this tetragonal material with a c-axis length of 64.7 angstrom to be measured. The thermal conductivity tensor coefficients k(33) = 1.10Wm(-1) K-1 and k(11) = k(22) = 1.80Wm(-1) K-1 were determined by growing epitaxial Sr4Bi4Ti7O24 films on (100), (110), and (111) SrTiO3 substrates. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4733616]

Keyword(s): J

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Physics, Applied

Note: This work was supported by the Defense Advanced Research Projects Agency (DARPA) and the U.S. Army Aviation and Missile Research, Development, and Engineering Center (AMRDEC).<SUP>32</SUP> D. G. C. acknowledges support of the Air Force Office of Scientific Research MURI FA9550-08-1-0407. Sample preparation was performed by the UCLA Nanoelectronics Research Facility, and microscopy at the UCLA California Nanosystems Institute's (CNSI's) Electron Imaging Center for Nanomachines (EICN).

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