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Characterization of Lanthanum Lutetium oxide high-k / metal gate stacks for CMOS process integration
Nichau, A.FZJ* ; Schubert, J.FZJ* ; Rubio-Zuazo, J. ; Besmehn, A. ; Schnee, M.FZJ* ; Schäfer, A.FZJ* ; Castro, G. R. ; Mantl, S.FZJ*
2012
2012SpLine Users' Meeting
Seminar, Madrid, SpanienMadrid, Spanien, 16 Apr 20122012-04-16
Note: Record converted from VDB: 12.11.2012
Contributing Institute(s):
- Halbleiter-Nanoelektronik (PGI-9)
- Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)
Research Program(s):
- Grundlagen für zukünftige Informationstechnologien (P42)
Appears in the scientific report
2012