Journal Article

PreJuSER-25958

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png The interface screening model as origin of imprint in PbZrx/Ti1-x/O3 thin films 1 : dopant, illumination, and bias dependence

Grossmann, M. ; Lohse, O. ; Bolten, D. ; Boettger, U. ; Schneller, T. ; Waser, R.FZJ*

2002
American Institute of Physics Melville, NY

Please use a persistent id in citations: http://hdl.handle.net/2128/1219

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Elektrokeramische Materialien (IFF-EKM)

Research Program(s):

1. Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik (I01)

Appears in the scientific report 2002
Notes: This version is available at the following Publisher URL: http://jap.aip.org

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Database coverage:

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