Journal Article

PreJuSER-25964

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Structural and morphologic evolution of Pt/Ba0,7Sr0,3TiO3/Pt capacitors with annealing processes

Quin, Y. L. ; Jia, C. L. ; Urban, K.FZJ* ; Liedtke, R. ; Waser, R.FZJ*

2002
American Institute of Physics Melville, NY

Please use a persistent id in citations: http://hdl.handle.net/2128/1220

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Elektrokeramische Materialien (IFF-EKM)
2. Mikrostrukturforschung (IFF-IMF)

Research Program(s):

1. Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik (I01)
2. Kondensierte Materie (M02)

Appears in the scientific report 2002
Notes: This version is available at the following Publisher URL: http://jap.aip.org

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Database coverage:

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