Journal Article

PreJuSER-36538

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Atomic force microscopy study of laser induced phase transitions in Ge2Sb2Te5

Weidenhof, V. ; Friedrich, I. ; Ziegler, S. ; Wuttig, M.

1999
American Institute of Physics Melville, NY

Please use a persistent id in citations: http://hdl.handle.net/2128/17200

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Institut für Grenzflächenforschung und Vakuumphysik (IGV)

Research Program(s):

1. Grenzflächenaspekte der Informationstechnik (25.35.0)

Appears in the scientific report 1999

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Database coverage:

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