Journal Article

PreJuSER-39980

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Influence of La-doping of YBCO on transport properties of interface-engineered ramp-edge junctions

Heinsohn, J.-K.FZJ* ; Dittmann, R.FZJ* ; Rodriguez Contreras, J.FZJ* ; Scherbel, J.FZJ* ; Klushin, A. M.FZJ* ; Siegel, M.FZJ*

2001
IEEE New York, NY

Please use a persistent id in citations: http://hdl.handle.net/2128/1250

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Institut für Bio- und Chemosensoren (ISG-2)
2. Elektrokeramische Materialien (IFF-EKM)

Research Program(s):

1. Schichtsysteme und Bauelemente der Supraleiterelektronik (29.85.0)

Appears in the scientific report 2001
Notes: This version is available at the following Publisher URL: http://ieeexplore.ieee.org/Xplore/dynhome.jsp

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Database coverage:

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