Journal Article

PreJuSER-4042

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Capacitance and admittance spectroscopy analysis of hydrogen-degraded Pt/(Ba,Sr)TiO/Pt thin-film capacitors

Liedtke, R. ; Grossmann, M. ; Waser, R.FZJ*

2000
American Institute of Physics Melville, NY

Please use a persistent id in citations: http://hdl.handle.net/2128/822

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Institut für Festkörperforschung (IFF)

Research Program(s):

1. Festkörperforschung für die Informationstechnik (23.42.0)

Appears in the scientific report 2000
Notes: This version is available at the following URL: http://apl.aip.org

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Database coverage:

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