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Absorption loss at the nanorough silver back reflector of thin-film silicon solar cells

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2004
American Institute of Physics Melville, NY

Journal of applied physics 95, 1427 - 1429 () [10.1063/1.1633652]

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Abstract: Absorption losses at a nanorough silver back reflector of a solar cell were measured with high accuracy by photothermal deflection spectroscopy. Roughness was characterized by atomic force microscopy. The observed increase of absorption, compared to the smooth silver, was explained by the surface plasmon absorption. Two series of silver back reflectors (one covered with thin ZnO layer) were investigated and their absorption related to surface morphology. (C) 2004 American Institute of Physics.

Keyword(s): J

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Note: Record converted from VDB: 12.11.2012

Contributing Institute(s):
  1. Institut für Photovoltaik (IPV)
Research Program(s):
  1. Photovoltaik (E02)

Appears in the scientific report 2004
Notes: This version is available at the following Publisher URL: http://jap.aip.org
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