| Hauptseite > Publikationsdatenbank > Growth of homoepitaxial strontium titanate thin films by molecular-beam epitaxy |
| Journal Article | PreJuSER-4557 |
; ; ; ; ;
2009
American Institute of Physics
Melville, NY
This record in other databases:
Please use a persistent id in citations: http://hdl.handle.net/2128/17252 doi:10.1063/1.3117365
Abstract: We report the structural properties of homoepitaxial (100) SrTiO3 films grown by reactive molecular-beam epitaxy (MBE). The lattice spacing and x-ray diffraction (XRD) rocking curves of stoichiometric MBE-grown SrTiO3 films are indistinguishable from the underlying SrTiO3 substrates. Off-stoichiometry for both strontium-rich and strontium-poor compositions (i.e., Sr1+xTiO3+delta films with -0.2 < x < 0.2) results in lattice expansion with significant changes to the shuttered reflection high-energy electron diffraction oscillations, XRD, and film microstructure. The dependence of lattice spacing on nonstoichiometry is smaller for MBE-grown films than for homoepitaxial (100) Sr1+xTiO3+delta films prepared by pulsed-laser deposition or sputtering.
Keyword(s): J ; epitaxial layers (auto) ; molecular beam epitaxial growth (auto) ; reflection high energy electron diffraction (auto) ; stoichiometry (auto) ; strontium compounds (auto) ; X-ray diffraction (auto)
|
The record appears in these collections: |