| Hauptseite > Publikationsdatenbank > Photomixers fabricated on nitrogen-ion-implanted GaAs |
| Journal Article | PreJuSER-46374 |
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2005
American Institute of Physics
Melville, NY
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Please use a persistent id in citations: http://hdl.handle.net/2128/2015 doi:10.1063/1.2006983
Abstract: We report on fabrication and measurement of photomixers based on nitrogen-ion-implanted GaAs. We used energies of 500 keV, 700 keV, and 880 keV to implant N+ ions into GaAs substrates with an ion concentration of similar to 3x10(12) cm(-2). The resulting material exhibited 110 fs carrier lifetime due to implantation-induced defects. Our photomixers were fabricated as metal-semiconductor-metal devices, placed at the feed point of a broadband antenna. Optoelectronic measurements were performed in the wavelength range between 350 nm and 950 nm. In comparison to their counterparts (photomixers fabricated on low-temperature-grown GaAs) the N+-implanted GaAs photomixers exhibit improvements on both the output power and responsivity. A maximal responsivity of above 100 mA/W was achieved and we did not observe any dependence of the mixer cut-off frequency on the bias voltage. These characteristics make N+-implanted GaAs the material of choice for efficient optoelectronic photomixers. (c) 2005 American Institute of Physics.
Keyword(s): J
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