On the characterization of a Bragg spectrometer with X-rays from an ECR source

Anagnostopoulos, D. F.; Gotta, D.; Gruber, A.; Wasser, A.; Indelicato, P.; Biri, S.; Fuhrmann, H.; Zmeskal, J.; Stingelin, L.; Simons, L. M.; Leoni, B.

doi:10.1016/j.nima.2005.01.311

Journal Article

On the characterization of a Bragg spectrometer with X-rays from an ECR source

Anagnostopoulos, D. F. ; Biri, S. ; Gotta, D.FZJ* ; Gruber, A. ; Indelicato, P. ; Leoni, B. ; Fuhrmann, H. ; Simons, L. M. ; Stingelin, L. ; Wasser, A. ; Zmeskal, J.

2005
North-Holland Publ. Co. Amsterdam

Nuclear instruments & methods in physics research / A 545, 217 (2005) [10.1016/j.nima.2005.01.311]

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Please use a persistent id in citations: http://hdl.handle.net/2128/10653 doi:10.1016/j.nima.2005.01.311

Abstract: Narrow X-ray lines from helium-like argon emitted from a dedicated ECR source have been used to determine the response function of a Bragg crystal spectrometer equipped with large area spherically bent silicon (111) or quartz (101) crystals. The measured spectra are compared with simulated ones created by a ray-tracing code based on the expected theoretical crystal's rocking curve and the geometry of the experimental set-up. (c) 2005 Elsevier B.V. All rights reserved.

Keyword(s): talk: Novosibirsk 2003/09/22 ; electron: particle source ; particle source: polarized beam ; photoelectron ; gallium: arsenic ; beryllium: admixture ; electron positron: linear collider ; linear collider: proposed ; X-ray spectroscopy (auto) ; exotic atoms (auto) ; ECR source (auto)