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000049699 084__ $$2WoS$$aMaterials Science, Multidisciplinary
000049699 084__ $$2WoS$$aMetallurgy & Metallurgical Engineering
000049699 1001_ $$0P:(DE-Juel1)VDB518$$aGuo, X.$$b0$$uFZJ
000049699 245__ $$aIonic conduction in zirconia films on nanometer thickness
000049699 260__ $$aAmsterdam [u.a.]$$bElsevier Science$$c2005
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000049699 440_0 $$067$$aActa Materialia$$v53$$x1359-6454
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000049699 520__ $$aPolycrystalline 8 mol% Y2O3-stabilized ZrO2 films with thicknesses of 12 and 25 nm were deposited on (100) MgO substrates, their nanostructures were investigated by means of transmission electron microscopy (TEM), high-resolution TEM and atomic force microscopy, and the electrical properties of the nanostructured films were characterized in dry and humid O-2. Compared with microcrystalline bulk ceramics, the ionic conductivity of the nanostructured films is lower by about a factor of 4, which is mainly due to the lower bulk conductivity and the low grain-boundary conductivity. There is not remarkable proton conduction in the nanostructured films when annealed in water vapor, and the influence of the ZrO2/MgO interface on its ionic conduction is negligible. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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000049699 65320 $$2Author$$azirconia
000049699 65320 $$2Author$$ananostructure
000049699 65320 $$2Author$$aelectrical properties
000049699 65320 $$2Author$$alaser deposition
000049699 7001_ $$0P:(DE-HGF)0$$aVasco, E.$$b1
000049699 7001_ $$0P:(DE-HGF)0$$aMi, S.$$b2
000049699 7001_ $$0P:(DE-Juel1)VDB2799$$aSzot, K.$$b3$$uFZJ
000049699 7001_ $$0P:(DE-HGF)0$$aWachsman, E.$$b4
000049699 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b5$$uFZJ
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