Journal Article

PreJuSER-52691

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Microwave properties of HTS films: measurements in millimeter wave range

Cherpak, N. T. ; Barannik, A. A. ; Prokopenko, Y. V. ; Filipov, Y. F. ; Vitusevich, S. A.FZJ*

2006
Inst. College Park, Md.

This record in other databases:    

Please use a persistent id in citations: http://hdl.handle.net/2128/2130  doi:10.1063/1.2215377

Abstract: A theoretical and experimental justification of an approach proposed and developed by us for surface impedance standard measurements of HTS films is presented. An analysis of the electromagnetic properties of quasi-optical dielectric resonators with conducting endplates, which provides a theoretical background for studies of HTS films in the millimeter wave range, is performed. With this technique, the highest-quality modes, namely whispering gallery modes, are excited in a dielectric cylindrical disc sandwiched between HTS films. Considerable enhancement of the sensitivity of surface resistance measurements in the millimeter wave range is demonstrated, which is important for the fundamental investigation of superconductor physics. It is also shown that the measured frequency shift in the resonator with the HTS endplates as a function of the temperature reveals a possibility for accurate evaluation of the field penetration depth in HTS films.

Keyword(s): J

Note: Record converted from VDB: 12.11.2012

---

Contributing Institute(s):

1. Institut für Bio- und Chemosensoren (ISG-2)
2. Center of Nanoelectronic Systems for Information Technology (CNI)

Research Program(s):

1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2006
Notes: This version is available at the following Publisher URL: http://ltp.aip.org

---

Database coverage:

---