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| Home > Publications database > Residual stress mapping in the zirconia electrolyte layer of a high-temperature solid oxide fuel cell |
| Journal Article | PreJuSER-57452 |
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2006
Oldenbourg
München
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Please use a persistent id in citations: doi:10.1524/zksu.2006.suppl_23.299
Abstract: X-ray residual stress evaluation has been employed to measure stress distributions in the electrolyte layer of a single anode-supported planar solid oxide fuel cell at several manufacturing steps. The mainly thermal residual stress in the about 10 gm thick electrolyte layer is about -560 MPa at room temperature and constant across the whole cell plate. Chemical reduction of the anode leads to a slight reduction of the compressive stress to -520 MPa, still ensuring that the electrolyte layer remains under compression up to operation temperature of about 800 degrees C.
Keyword(s): J ; powder diffraction (auto) ; residual stress mapping (auto) ; solid oxide fuel cell (auto) ; yttria-stabilized zirconia (auto)
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