Home > Publications database > Evidence for a mixed CoNiO layer at the Co/NiO(001) interface from surface x-ray diffraction |
Journal Article | PreJuSER-57646 |
; ; ;
2006
APS
College Park, Md.
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Please use a persistent id in citations: http://hdl.handle.net/2128/7709 doi:10.1103/PhysRevB.73.125401
Abstract: The clean and cobalt-covered NiO(001) surface was studied by surface x-ray diffraction. The NiO(001) surface prepared by annealing in air at 1000 degrees C is characterized by a strong expansion of the top interlayer spacing (approximate to 14% relative to the bulk NiO-spacing of 2.085 A) and an outward relaxation (0.28 A) of the oxygen atoms, which can be related to a high (27%) concentration of oxygen vacancy defects. In addition we find an oxygen-layer (most likely as part of the OH- anion) on top of the surface Ni atoms at a distance of 2.33 A. Deposition of 0.8 monolayers of Co induces a complex surface restructuring involving the formation of double layer CoO-islands above an oxygen deficient interfacial oxide layer ([NiCo]O-0.5) in registry with the underlying NiO single crystal. Our results support previous spectroscopic studies suggesting the presence of uncompensated interfacial spins responsible for the exchange bias.
Keyword(s): J
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