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| Home > Publications database > Chemical modifications of Pb(Zr0.3,Ti0.7)O3 precursor solutions and their influence on the morphological and electrical properties of the resulting thin films |
| Home > Publications database > Chemical modifications of Pb(Zr0.3,Ti0.7)O3 precursor solutions and their influence on the morphological and electrical properties of the resulting thin films |
| Journal Article | PreJuSER-58030 |
;
2007
Springer Science + Business Media B.V
Dordrecht [u.a.]
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Please use a persistent id in citations: doi:10.1007/s10971-007-0764-2
Abstract: Tetragonal lead zirconate titanate thin films on platinized silicon wafers have been prepared from chemically different precursor solutions by chemical solution deposition. Literature known routes have been evaluated and an optimized standard process has been developed leading to Pb(Zr-0.3,Ti-0.7)O-3 films with a high degree of (111) orientation which consequently shows square hysteris loops with Pr values of 34 mu C/cm(2).Other solvents, different alkoxides of the transition metals, and different carboxylates of lead have been systematically introduced in this standard process and their influence on the final morphological and electrical properties has been studied. It has been found that the use of lead (II) propionate and titanium tetra n-butoxide for solution synthesis leads to a decrease of the remanent polarization of similar to 50%. Furthermore the reaction atmosphere after spinning and during the pyrolysis has been investigated. Increased ambient humidity after the spin coating process also caused a significant deterioration of the final film properties. The findings have been explained in terms of a hindered formation of the (111) texture promoting intermediate PtxPb phase.
Keyword(s): J ; chemical solution deposition (auto) ; electronic oxide films (auto) ; ferroelectric (auto) ; PZT (auto) ; thin films (auto) ; XRD (auto) ; SEM (auto) ; microstructure (auto) ; hysterisis (auto)
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